Back to overview
Atomic Force Microscopy Measurement Platform

Atomic Force Microscopy Measurement Platform

  • AFM
  • Mechanical Design
  • System Integration
Tools: LabVIEW, Python, FPGA
Year: 2025

Overview

Correlated nanoscale measurements require exceptional mechanical stability, precise motion control, and efficient experimental workflows. This project focused on the development of an atomic force microscopy (AFM) platform integrating surface characterization and nanoindentation within a single measurement system.

The platform combined custom mechanical design, optical microscope integration, LabVIEW-based control, and Python extensions for automation. Semi-automated calibration and measurement routines improved usability and repeatability, while experimental validation demonstrated sub-nanometer resolution across multiple material systems.

Key Contributions:

  • Mechanical design optimized for precision and vibration resistance
  • Integration of AFM, nanoindentation, and optical microscopy
  • LabVIEW-based control of scanner head and motion system
  • Python-based automation via TCP interfaces
  • Semi-automated calibration and measurement workflows
  • Experimental validation on multiple materials
  • Sub-nanometer measurement resolution for surface characterization and material analysis